3D microscopy
Hirox HRX-02
360° observation, 3D reconstruction and high-resolution measurement up to 10,000×.
Discover features and functions →Request a trial
FROM THE PROBLEM TO THE MEASUREMENT
We do not start from the instrument.
We start from your application.
Describe the component, material or defect to be analysed. Simitecno specialists identify the most suitable technology and arrange an application trial on your own sample.
TECHNOLOGIES
A complete platform to understand and control materials
Confocal profilometry
NPS
Non-contact scanning of profiles, surfaces and roughness with nanometre resolution.
NPS features →
3D optical profilometry
TARAZ ASM
Non-contact measurement of surface topography and areal roughness using blue-light fringe projection.
Explore the TARAZ profilometer →
DEMO CENTRE @ IIT MILAN
Try the technology on a real case
The Demo Centre at the Center for Nano Science and Technology of the Istituto Italiano di Tecnologia is dedicated to 3D digital microscopy and advanced optical metrology.
Book a demonstrationTRADE FAIRS AND WORKSHOPS · CALENDAR AND ROADMAP
Next events and workshops
In program and in preparation: explore the technologies, applications and test opportunities on your samples.
OPEN HOUSE
24 and 25 November 2026
Open House Werth Italia
Casorate Sempione (VA)
Live demonstrations of Hirox 3D digital microscopy, multisensor CMMs and computed tomography.
WORKSHOP
Dates to be confirmed
IIT workshop – Milan
IIT · CNST · Milan
Automated microdefect detection and 3D surface topography
3D digital microscopy, structured-light scanning and AI for in-line quality control.
Exposed instrumentation
- Hirox with benchtop stand
- NPS
WORKSHOP
Dates to be confirmed
University of Messina workshop
University of Messina
Exposed instrumentation
- Hirox
- Mitaka
TRADE FAIR
3–5 March 2027
MECSPE
Venue to be confirmed
Configuration to be confirmed
Configuration to be confirmed.
THEMATIC TRACKS
Upcoming workshop roadmap
Seventeen application tracks dedicated to materials analysis. Dates and venues are being finalised.
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for cultural heritage
Non-invasive surface documentation and before/after comparison of restoration work.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
Integrated HIROX system for ceramics
3D microscopy, structured light and artificial intelligence for surface inspection, from raw material to finished product.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
HIROX and MITAKA for thin films
Multiscale imaging and laser profilometry for the characterisation of thin films and photovoltaic devices.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for metallography
From microstructures to failure analysis: observation, 2D/3D measurement and quantitative image analysis.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D digital microscopy for microelectronics
Inspection of assemblies, packaging and integrated circuits with 360° imaging, stitching and 2D/3D measurement.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for fashion and jewellery
Fibres, leathers, finishes and jewellery: observing the details and documenting material quality.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for the life sciences
Zoology, entomology and botany through multifocal imaging, 3D reconstruction and sample documentation.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for Earth sciences
Rocks, minerals, fossils and sediments: morphological characterisation and microtopographic surveys.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for forensic science
Micro-traces, exhibits and materials: imaging and measurement to document and compare observable details.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
HIROX for biomaterials and scaffolds
From polymers to scaffolds: morphological analysis, topography and surface inspection for biomaterials research.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for glass and coatings
Glass failure analysis, surface defects and coatings: illumination, dimensional measurement and topography.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for fibres and textiles
From single fibres to fabric: measurement, stitching and documentation for laboratory, development and quality control.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
Surface and failure analysis
From topography to defects: optical metrology, coatings, wear and inspection automation.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for paper, board and packaging
Fibre structure, finishes and defects for the development and inspection of packaging materials.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
Paper, printing and inks
Paper texture, ink distribution and print detail with dedicated imaging and illumination.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
3D microscopy for composites
Fibres, matrix and laminates: multiscale inspection, dimensional measurement and defect analysis.
Discover the track →
THEMATIC WORKSHOP
Upcoming workshop roadmap
Dermatology, trichology, cosmetics and pharmaceuticals
Imaging and measurement for research, surface characterisation and quality control of products and materials.
Discover the track →Registration and demos on request by e-mail: we agree attendance and samples together.
2026 · 2025
Past events
WORKSHOP
09 October 2026
CNR ISM workshop – Frascati
Frascati
Announced instrumentation
- 1 Mitaka
- 1 Hirox with Rvomax + NPS
TRADE FAIR · LIVE TESTING
13–16 October 2026
BI-MU – Milan
Fieramilano Rho · Hall 22 · Stand E31
Announced instrumentation
- 1 gantry with Hirox
- 2 Hirox with benchtop stands, one of them with NPS
- 1 cobot with Taraz
- 1 cobot cell with Hirox
TRADE FAIR · APPLICATION DEMOS
27–29 October 2026
A&T – Vicenza
Vicenza
Announced instrumentation
- 2 Hirox with benchtop stands, one of them with NPS
- 1 cobot with Taraz
ARCHIVE · 2025
5–7 March 2025
MECSPE · Bologna
Industrial fair dedicated to technologies for manufacturing and quality control. Simitecno presented its solutions and collected application contacts.
ARCHIVE · 2025
11 April 2025
Workshop CNR ISAC · Bologna
Application meeting on particulate matter and cultural heritage, with 3D digital microscope and surface analysis.
ARCHIVE · 2025
17–19 June 2025
Macro–Micro–Nano is Politecnico di Milano
Three days of multi-scale demonstrations with HIROX HRX‐02, NPS and Polytec Micro.View.
ARCHIVE · 2025
2025
NanoInnovation · Rome
Presentation and demonstrations dedicated to the characterization of nanostructured materials and surfaces.
ARCHIVE · 2025
7–11 September 2025
ESB · Turin
Participation in the conference on biomaterials: 3D microscopy and optical metrology for the research and control of surfaces.
ARCHIVE · 2025
2025
SurfaceLab · Rome
Application meetings on surfaces and biomaterials, with comparison of imaging and measurement needs.
Content 2025 summarizes the known initiatives; photographs, presentations and additional reports will be integrated when available.
VIDEOS AND DEMONSTRATIONS
Simitecno Italia YouTube channel
The channel collects application videos, demonstrations and presentations of the quality control technologies offered by Simitecno and its partners: 3D digital and confocal microscopy, profilometry, optical metrology, 3D scanning, tomography, automation and inspection robotics.
Visit the channel and watch the videosDO YOU HAVE A DEFECT TO IDENTIFY?
Show us your sample.
We will show you how to measure it.
SIMITECNO INSTRUMENTS
Comprehensive materials inspection, from 3D surface analysis to internal structure and chemical composition.
Explore images, features, applications and configurations. Each card leads to the full technical page and to a sample trial request.
3D DIGITAL MICROSCOPY
Observation, measurement and automation
Modular systems to analyse details, surfaces and complex components in the laboratory or in production processes.
3D microscopyHirox 3D Digital Microscope
High-resolution three-dimensional scanning and measurement, 360° observation and magnification up to 10,000×.
- Multifocus and 2D/3D stitching
- Metrology and particle analysis
- Motorised rotary optics
Confocal profilometryNPS profilometer
White-light chromatic confocal profilometer for non-contact scanning of profiles and surfaces.
- Resolution down to 76 nm in Z
- Acquisition up to 2,000 points/s
- Roughness, form and topography
Laser metrologyMitaka PF‑60 laser profilometer
Real-time 3D measurement with single-point focusing, non-contact and without field stitching.
- Autofocus scale resolution 0.01 µm
- X × Y × Z range: 60 × 60 × 60 mm
- Opaque, transparent and reflective surfaces
Taraz ASM
Blue-light fringe projection optical system to measure surface topography, form and roughness without contact.
- Four fields of view and resolutions available
- Acquisition in 2 seconds or less
- ISO 25178 analysis with TarazSurf
Robotics and AIHiroxBot
The integration of HIROX with collaborative robots automates inspection, quality control and measurement.
- Repeatable recipes and positions
- PCB and component inspection
- Reduced operator variability
All-around scanning5-axis Mitaka laser profilometer
Laser CMM to measure forms, profiles and internal and external surfaces from different directions.
- 5 programmable motorised axes
- Components up to 120 mm
- Steep angles below 87°
X-ray tomographyBenchtop CT scanner
Compact desktop micro‑CT system to observe defects, porosity and internal structures without sectioning the sample.
- Detectability down to 300 nm
- Sealed 110 kV source
- Optional in-situ 4D imaging
Post-process inspectionTaraz PM
Optical station for complete 3D measurement of complex components using fringe projection, photogrammetry and multi-view acquisition.
- 3D reconstruction from multiple viewpoints
- Comparison against CAD reference and tolerances
- Final inspection in the workshop and in production
POLYRIX · 3D SURROUND METROLOGY
PolyScan XS, XM, XL and XH
Multi-sensor systems with no moving parts, capturing the entire component in a single cycle, from small details to structures of 6.5 metres and beyond.
CAN’T FIND THE RIGHT CONFIGURATION?
Describe your sample and the result you need to achieve.
APPLICATIONS
Find the right solution for your industry
Each application links the problem, the measurement method, the result and the recommended technology.
Microelectronics
Bonding, solder joints, circuits, defects, contamination and dimensional inspection.
Explore the application →Metallography
Microstructures, inclusions, fractures, corrosion, roughness and failure analysis.
Assess the material →Aerospace and automotive
Complex components, critical surfaces, reverse engineering and automated inspection.
Study the inspection →Thin films
Thickness, topography, uniformity, defects and non-contact characterisation.
Explore the application →Cultural heritage
Non-invasive analysis, 3D documentation, pigments, surfaces and conservation.
Explore HIROX applications →Biological and forensic sciences
Observation with high depth of field, documentation and comparison of samples.
Describe your application →Pharmaceutical industry
Tablet coating, particle size, particle count, roughness and batch-to-batch control.
Explore the application →Earth sciences
Minerals, rocks, microfossils, fracture surfaces, inclusions and three-dimensional morphologies.
Study the geological sample →Surface fabrication
Surface weaving range evaluation with Mitaka PF-60 and comparison of results with and without S filter.
Open the publication (PDF) →← Back to applications
HIROX FOR MICROELETTRONICA
3D inspection of circuits, packages and microcomponents
From electronic assembly to failure analysis: high-resolution observation, 360° inspection, 2D/3D measurements and contactless confocal profilemetry.
Analyzes a component
HIROXBOT · ELECTRONIC
Automated optical inspection of electronic cards
Digital and robotic microscopy to observe components, tracks and welds and document controls on PCB cards.
AUTOMATIC OTTICAL METHOD
Automatic measurement of PCB microsections
From calibrated images of the HIROX digital microscope, the software measures copper layers, dielectric thicknesses, metallic walls and microway filling. It works offline and generates annotated images, PDF reports and CSV files for each sample.
DISTINTIVE FUNCTIONS
See the defect, measure it and document it
The configuration is adapted to circuit, package, wafer, connector or microcomponent.
Rotating optics
Inspection of pins, welds and geometries hidden by multiple angles without manipulating the component.
Focus and HDR
Full-focus images and reflex control on metals, resins and glossy surfaces.
Automatic Tiling
High-resolution and continuous 3D reconstructions of circuits and extended areas.
Quantitative measures
Lengths, areas, diameters, angles, heights, volumes, profiles and roughness Ra/Rz.
Selective illumination
Coaxial, annular, diffuse, polarized, IR and UV for different materials and contrasts.
Contactless confocale
Profiles and surfaces on reflective or transparent samples with submicrometric Z measurement.
Discover NPS →LIVE FOCUS
More focal planes, a single sharp image
Combine focal planes to obtain a focus image even on samples with height variations.
APPLICATION SCHEDE
Controls along the entire electronic process
01 · ASSEMBLY
Welding, BGA and bonding
Welded joint control, mounted components, bonding defects and flux residues.
02 · MICROCHIP
Reverse engineering
Observation of patterns, pistes, transistor and intra-chip details for study and comparison.
03 · METROLOGY
2D/3D dimensional measurements
Profiles, heights, volumes, roughness and pseudo-color patterns, wireframe or real color.
04 · MAPTURE
Stitching of extended circuits
Automatic union of 3D images and scans through coordinated movements XY and Z.
05 · FAILURE ANALYSIS
Crimes and process defects
Search for microcracks, fractures, delaminations, short circuits and interrupts of the tracks.
06 · NPS
Profiles and confocal surfaces
Planarity, copulity, wave, texture, defects and roughness on complex surfaces.
A COMPONENT TO ANALYSISTE?
We define optics, lighting and measurements on the sample.
← Back to applications
HIROX FOR FARMACEUTICAL INDUSTRY
3D inspection of tablets, coatings and granules
A correlative platform to verify uniformity of the coating, morphology, roughness, size, particles and variations between batches.
Analyze a sample
CONTROL FARMACEUTICAL QUALITY
From the whole tablet to the microstructure
HRX-RVOMAX, 3DT software and NPS sensor integrate high magnification imaging and surface metrology.
Macro Inspection
General documentation of the tablet, engravings, edges and dimensional characteristics.
Coating Analysis
Evaluation of the uniformity of the film by coaxial light and focus variation.
Topography and reliefs
Reconstruction of the surface, size of letters, carvings, heights and volumes.
Granulate analysis
Counting and classification of particles by shape and size.
dimensional control
Diameter, arc, area, perimeter and geometries of the whole or sectional tablet.
Rugour NPS
Interoperable confocal profilemetry with HIROX and MountainsMap metrological reports.
APPLICATION SCHEDE
Analysis performed on the pharmaceutical sample
01 - COATING
Uniformity of coating
1500× analysis with coaxial lighting and 3D reconstruction of the surface.
02 · RELIVE
Size of letters and markings
Height, profile and morphology of embossed details with 3D model export.
03 · GRANULATION
Reflected and transmitted light
Comparison of granulate morphology on matt support and on glass.
04 · PARTICULAR
Particle Count and Auto Area
Counting, classification and dimensional parameters with CSV and Excel export.
05 · SECTION
Tablets carved
Observation of the interior, roughness of the carving and three-dimensional reconstruction.
06 · NPS
ISO compliant wheels
Confocal profile with Z resolution of 60 nm and MountainsMap reporting.
A CONFRONTAL LIGHT?
We set up a repeatable protocol of imaging and measurement.
← Back to applications
HIROX + MITAKA FOR SOTTILI FILM
3D imaging and nanoscale surface measurement
An integrated solution to document the film, locate defects and discontinuity, reconstruct topography and measure contactless thicknesses and steps.
HIROXImaging 2D/3D
MITAKA PF-60Profile and step height
CORRELATIONAL METHOD
From optical location to quantitative measurement
The two technologies work on scales and complementary objectives: HIROX identifies and documents the area; PF-60 measures the profile with autofocus laser probe.
3D Exploration and Documentation
- Live Focus for surfaces with altitude variations.
- Live HDR for reflective films and critical contrast zones.
- Guide Map to find the region of interest.
- Car 2D/3D Tiling for extensive reconstructions.
- Polarized lighting, coaxial, oblique and annular.
- 2D/3D measurements, roughness and automatic reports.
High resolution laser profile
- Laser spot probe from 0.5 μm.
- XYZ standard area: 60 × 60 × 10 mm.
- XY Resolution: 0.1 μm.
- Resolution Z: 0.01 μm / 0.001 μm.
- Direct measurement of heights, edges and steep corners.
- Automatic scanning of wide and diversified surfaces.
FUNCTIONS FOR SOTTILI FILM
Controls from the visual defect to the nanometer step
Extended focus
Images fully on fire even on edges, steps and surfaces not perfectly planar.
Reflex management
Real-time visualization of clear and dark areas on reflective coatings and substrates.
Navigation of the ROI
The image at low magnification becomes a map connected to the position of the XY table.
Automatic Tiling
Continuous mosaics and topographic maps of larger areas of the individual field of view.
Profile and roughness
Profile curves, ripple and roughness parameters on selected lines or areas.
Measures and reports
Images, capture parameters, coordinates, results and transferable statistics in reports.
APPLICATIONAL CASES · FOTOVOLTARY PROVISIONS
Nb₂O₅ niobium oxide film on borosilicate glass
The illustrated sample presents a film deposited by PVD evaporator with a nominal thickness of 20 nm. The analysis combines the optical reconstruction of the entire film with the measurement of the step between substrate and coating.
- Nominal thickness
- 20 nm
- Profile distance
- 2,005μm
- Variation in height
- -19,95 nm
0-19,95 nm
OTTENABLE RESULTS
A complete application card of the film
Thickness and step height
Quantitative confirmation of the thickness deposited along selected profiles.
Uniformity and topography
Distribution of local quotas and variations on the analyzed area.
Surface defects
Pin-hole, particles, edges, scratches, discontinuity and contamination.
Traceability
Coordinates, images, parameters and measures comparable to samples and processes.
A FILM TO CHANGE?
We verify imaging and measure directly on the sample.
We define area, substrate, finish, waited step and required resolution.
← Back to applications
HIROX FOR CONSERVATION
3D microscopy for cultural heritage
Non-invasive scientific documentation, pre/post comparison restoration and quantitative analysis of surfaces, stratigraphy and fragile materials.
DISTINTIVE FUNCTIONS
A single platform, from reperto to measure
Modular optics and statics allow to work on small fragments, paintings, fabrics, manuscripts, sculptures and non-moving objects.
Rotating optics
Observation from multiple angles without turning or manipulating the reperto.
Multifocus and HDR
Completely on fire and reflex control even on irregular surfaces.
Automatic Tiling
High resolution mosaics and continuous 3D reconstructions of extended areas.
Special lighting
Polarized, oblique, diffused, UV and IR light to make readable hidden details.
Quantitative measures
Profiles, heights, areas, roughness and geometric comparison between analysis campaigns.
Traceability and reporting
Metadata, coordinates, images and measurements organized in repeatable reports.
APPLICATION SCHEDE
Six areas of investigation
Select an application to see objectives, HIROX configuration, specific functions and observation examples.
01 · DIPINTI
Painted surfaces
Craquelure, lifts, touches, abrasions and comparison before/after restoration.
02 · CROSS-SECTION
Materials and stratigraphy
Thicknesses, interfaces, pigment distribution and sequence of application layers.
03 · TEXTS
Fabrics and fibres
Ingots, yarns, abrasions, contaminants and non-invasive assessment of the conservative state.
04 · 3D SUPERFICI
Sculpture and stone materials
Microfessure, erosion, incrustations, roughness and volumetric loss.
05 · CAR AND PERGAMENA
Manuscripts and miniatures
Traits, gildings, pigments, engravings, annotations and alterations of fragile supports.
06 · REPERTIES
Archaeology and metals
Patins, corrosion, processing traces, encrustations and restoration monitoring.
A DOCUMENTAL REPERT?
We build the configuration around the work.
We value geometry, fragility, area to be acquired, lighting and measures required.
← Back to products
DIGITAL MICROSCOPLE 3D
Hirox HRX‑02
From microscopic detail to three-dimensional reconstruction: observation, measurement and sample documentation in one platform.
HYROX
A single system, from the overview up to 10,000×
HRX‐02 combines motorized optics, UHD acquisitions, software controlled illuminations and 2D/3D metrology. Modular configurations allow you to adapt optical body, lens, static and sample accessories and control process.
0.1×–10.000×Field of magnificence
5 MP · 50 fpsAcquisition UHD
up to 500 nmMeasurement resolution
360°Optical sample inspection
EXCLUSIVE FUNCTIONS WORLDWIDE
Twelve capabilities integrated into one platform
From optical acquisition to confocal profilemetry, to robotic automation and correlation with CAD and FEM models.
01
From 10× to 10,000× with the same optical head
Quick transition from overview to microscopic detail without changing acquisition platform.
02
Rotary Head 360°
Automated lateral observation of edges, holes, welds, subframes and complex geometries.
03
Complete remote control
Smart Joystick, touch screen and API to govern acquisition, movement and control recipes.
04
Double 3D mapping
Optical Multi-Focus and NPS Nano Point Confocal Scanner to choose the most suitable method for the surface.
05
Infinite Auto‐Focus
Instant focus along the observed field, even during the exploration of the sample.
06
Big Picture / Infinite Stitching 2D/3D
High-resolution panoramic scans to move from the complete view of the sample to the single detail.
07
AutoReport + MountainsMap
Advanced metrological analysis and automatic generation of repeatable and shared reports.
09
Multi-spectral acquisition
VIS, UV and NIR observation to highlight details and contrasts that cannot be read in the visible light alone.
10
Automated angle lighting
Controlled light management to bring out reliefs, engravings, defects and superficial morphologies.
11
Diffused lighting
J‐LED and J‐SFL systems to illuminate evenly complex, metallic and reflective samples.
12
AutoFocus and Z‐Stacking HR
High-resolution focal series combined in fully focus images and 3D reconstructions.
13
HiroxBot, calculation and CAD/FEM
Robotized inspection, contamination, reverse engineering, computational analysis and related 3D modeling.
PRODUCTS AND LIGHTS
Observe complex surfaces from normally inaccessible angles
HIROX EXCLUSIVE
360° motorized rotary optics
It allows you to observe subframes, holes, edges, grooves and lateral surfaces without constantly manipulating the component.
RVOMAX optical body
Integrate high-resolution chamber, macro lens 10–80×, mid‐range 100–500× and additional lenses to reach up to 10,000×.
Motorized telecentric zoom
Supports accurate 3D reconstructions even at low magnification, reducing prospect distortion.
Selectable illumination
Light and dark field, coaxial, segmented, directional, diffuse, polarized, UV and IR for different materials and morphologies.
Configurable states
Manual or motorized axes, high precision Z axis and XY stages from 50 × 50 mm up to 1,500 × 1,500 mm.
HIROX OTTLE GAMMA
From the macro-to-retail vision up to 10,000×
The HRX‐02 platform can be configured with motorized or manual optical groups. The choice depends on visual field, resolution, working distance, field depth and sample geometry.
HRX-RVOMAX
Integrated unit with 5 MP room, motorized zoom, door-to-objective tower and built-in lighting.
HR‐1020E telecentric
High resolution motorized zoom, wide field of view and reduced perspective distortion: indicated for accurate 3D dimensional measurements and reconstructions.
HR‐2500E / HR‐5000E
Revolver optics with three lens turret and double illumination, designed to quickly switch from the microscopy detail component.
HR‐2016E · low magnification
Compact and versatile body for large samples, general control, documentation and applications requiring a wide field of view.
HR‐5040E · medium magnification
Large depth of field and long working distance for irregular surfaces, three-dimensional components and operations that require space around the sample.
HR‐10CE · High resolution
High magnification zoom with six interchangeable lenses for microstructures, particles, fine defects and analysis requiring maximum optical resolution.
HRX‐RVOMAX · OPTIC CONFIGURATION
From 10× to 10,000× with a single optical body
The motorized turret combines the Macro optics and the OLE‐100, OLE‐350, OLE‐500, OLE‐700 and OLE‐1000 lenses. The system switches from the general view of the sample to the analysis of the most fine details, maintaining the integrated management of zoom, focus and lighting.
30,5–0,04 mm horizontal visual field33–1 mm working distance3 modes dark field, mixed and clear
Select the image to enlarge
| Optics | Selectable magnifiers | Working distance |
|---|---|---|
| Macro | 10× · 20× · 30× · 50× · 80× | 33 mm |
| OLE-100 | 100× · 150× · 200× · 300× · 400× · 500× | 18 mm |
| OLE-350 | 350× · 500× · 700× · 1,000× · 1.400× · 2.000× | 10 mm |
| OLE-500 | 500× · 700× · 1,000× · 1,500× · 2.000× · 2.500× | 5 mm |
| OLE-700 | 700× · 1.000× · 1,500× · 2.500× · 3.000× · 3,500× · 5.000× · 7.000× | 3 mm |
| OLE-1000 | 1,000× · 1,500× · 2.000× · 3.000× · 4.000× · 5.000× · 7.000× · 10.000× | 1 mm |
Selectable lighting: dark field, combined and light field. Macro optics work in dark field; OLE‐100 in light field.
HIROX CONFIGUREMENT
Custom logs for each geometry and control process
From compact position to bridge and robotic systems: each tripod is designed and customised on the user's application needs.
PROJECT ON MEASURE
Mechanics, handling and electronics configured around the process
The number of motorized axes, the useful stroke, resolution, precision and speed of movement are defined according to the sample, the area to be inspected, the cycle time and the required automation level.
- Motorized axesConfigurable number and cinema
- RaceSized on the control area
- ResolutionSelected according to the size
- Speed speedOptimized compared to cycle time
- Smart FactoryInterfaceable control electronics with PLC, MES and factory systems
HIROX
Stand range available
Standard and special configurations for HRX‐02 digital microscope and, where expected, confocal profile NPS.
01
XY portals and systems for large areas
Extended rigid structures and racing for mapping, stitching and automatic control of panels, PCBs, voluminous works and components.
02
Collaborative robots and automatic cells
Flexible configurations to reach multiple sides of the piece, store the control points and integrate the microscope into the production line.
03
Compact, manual and special statistics
Bench or transportable solutions for quick controls, local samples and measures that require great accessibility.
SOFTWARE 4K
From image to metrological data
Observation settings can be stored and recalled, increasing speed and repeatability. Encoded lenses and identified accessories reduce configuration errors.
Try these functions on the sampleLive HDR
Automatic optimization of brightness, contrast and exposure even on difficult surfaces.
Live Multi Focus
Fully focus images of objects with strong height differences.
Stitching 2D and 3D
Automatic union of adjacent areas to create high-resolution navigable maps.
2D Measures
Length, diameter, perimeter, angle and area with automatic calibration.
Metrology 3D
Profiles, heights, distances, volumes, roughness, rays and virtual sections.
Particle analysis
Automatic detection, classification and pass/fail results with statistical data.
APPLICATIONS
Configured around your component
DOESN'T YOU KNOW WHAT CONFIGURATION TO DECID?
Bring your sample to the Demo Center.
We will evaluate the most suitable optical, lighting, static and measuring method.
← Back to products
CROMATIC CONFOCAL PROFILOMETRIES
NPS Nano Point Scanner
Submicrometric measurements of profiles, shapes and surfaces without contact, even on transparent, reflective or mirrored materials.
Request a NPS test76 nmAccuracy Z up to
2,000 points/sAcquisition of height
150–24,000 μmFull range of sensors
ISO 25178-602Color confocal profilemetry
METROLOGY AND MICROSCOPY
Two related tools on the same sample
The HIROX digital microscope quickly detects the area of interest and documents the high-resolution sample. The NPS sensor then performs the contactless confocal measurement on the same area, transforming the wavelength reflected into a Z share.
- Opaque, glossy, reflective or transparent samples
- Measurements in ambient light, without destructive preparation
- Transition from optical vision to 3D metrology
MAIN FEATURES
Non-contact 3D profilemetry, from roughness to shape
NPS combines a chromatic confocal point sensor, a high-precision XY stage and HIROX Maps metrological software. The configuration is chosen according to the Z field, the working distance, the slope of the surface and the required resolution.
Any surface area
Measure opaque, glossy, mirrored, rough or transparent materials without contact with the sample.
Profile and surface
Acquisition of single, programmable multi-profiles and high-resolution XYZ maps.
Large areas
Configurable motorized staves and boards up to 500 × 500 mm for flatness, undulating and composing.
Automatic control
Reusable templates, tolerance limits, pass/fail outcome and exportable results for traceability.
PRINCIPLE OF MEASURE
From white light to XYZ
- Projection. The white light LED crosses the beamsplitter and the chromatic lens.
- Focalization. Each wavelength is focused on a different height on the surface.
- Confocal selection. The pinhole isolates the only perfectly focused wavelength.
- Conversion. The spectrometer translates the wavelength into height information.
The controlled movement of the XY stage turns the individual points into a linear profile or into a three-dimensional surface.
MODE OF ACQUISITION
Quick profile to 3D topography
The scanning strategy is chosen according to the geometry, area and parameter to be controlled.
High speed profile
Scan on a board for height, distance, radius, angle and linear roughness Ra, Rz and Rt.
Programmable Multiprofile
Multiple sections acquired in sequence and gathered in a single comparable report.
High resolution surface
Lined profiles generate XYZ data for Sa, Sz, volume, shape, wave and topography.
Form and large areas
Planarity, modularity, deformation and free geometries with internships up to 500 × 500 mm.
CONFIGURATION MODULATION
A sensor for each measurement scale
The most contained field favours accuracy; larger fields allow to measure higher components and extended forms.
| Sensor | Camp Z | Working distance | Maximum pendence | Lateral resolution | Accuracy Z* | Roughness |
|---|---|---|---|---|---|---|
| NP1 | 150μm | 3,3 mm | 42° | 1.3 μm | 76 nm | Yes. |
| NP2 | 400 μm | 10.8 mm | 28° | 1.7 μm | 169 nm | Yes. |
| NP3 | 1.400 μm | 12.2 mm | 25° | 2,6 μm | 500 nm | Yes. |
| NP4 | 4,000 μm | 16,5 mm | 21° | 7 μm | 1.195 | No. |
| NP5 | 12,000 μm | 26,6 mm | 14° | 11 μm | 3.350 nm | No. |
| NP6 | 24,000 μm | 20 mm | 8,5° | 11 μm | 6,850 nm | No. |
| NPX‐1 | 1,000 μm | 18,5 mm | 44° | 2.5 μm | 334 nm | Yes. |
| NPX‐2 | 2,000 μm | 19.2 mm | 42° | 3,8 μm | 675 nm | Yes. |
| NPX‐6 | 6,000 μm | 13,7 mm | 32° | 5.2 μm | 1.750 nm | Yes. |
*The height accuracy also depends on the accuracy of the XY table. The maximum gradient is based on a perfectly speculative surface; additional sensors and configurations are available upon request.
NPS + HIROX MAPS
Automatic measurement, analysis and reports
The NPS software controls stage, sensor, frequency, light intensity and points of interest. The raw data is processed in Hirox Maps with Mountains technology for advanced analysis and repeatable procedures.
Live acquisition
Profile or map in false colors displayed during scanning.
Data correction
Leveling, removal of form, management of unmeasured points and extraction of areas.
Metrology Template
Reusable analysis sequences on samples and subsequent batches.
Pass/fail and export
Automatic tolerances, statistics and export CSV, Excel, STL and 3D formats.
REAL APPLICATIONS
3D measures for research, laboratory and process control
Each image shows the link between sample, contactless acquisition and metrological result.
01
Semiconductors
Step height, thin films, wafer flatness and topography of microfabricated structures.
02
Microelectronics
Height of components, textures, welds, pads, pistes and surface defects.
03
Automotive
Roughness, wear, sealing surfaces and geometry of precision machined components.
04
Aerospace
Profiles, edges, coatings, curvature and damage of critical components.
05
Optics
Fresnel lenses, transparent or mirrored surfaces, shape, radius and microstructures.
06
Tribology
Depth of the grooves, removed volume, roughness and characterization of wear tracks.
07
Packaging 3D
Micro-bump, interposer, stacked dies, height and complacency of interconnections.
08
Clockwork
Gears, teething, engravings, finishing and wear of movement components.
PROFILOMETRIES WITHOUT CONTACT
We verify resolution, field and sensor on your sample.
Technical data verified on Official HIROX Europe tab of Nano Point Scanner. The configuration and final performance must be confirmed according to sensor, table and application.
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TARAZ METROLOGY · AREAL SURFACE
ASM — 3D areal surface measurement
Optical projection of fringes in blue light to quickly acquire shape, topography and roughness of metals, polymers and composites, without contact with the sample.
4measurement configurations
1 μmLateral resolution
< 2Acquisition
ISO 25178analytical analysis
FROM LABORATORY TO LINE
A platform, four control ladders
ASM is the most advanced Taraz system based on blue light fringe projection. The non-contact optical measurement produces a full 3D point cloud of the surface and can be configured for off-line controls, automatic stations or online integration.
The same architecture covers precision components, processed surfaces, coatings and large panels, maintaining a common software flow with TarazSurf.
- Quick and adjustable measurement of metals, polymers and composites
- Complete traceability according to NPL metrological guidelines
- Software and integration that can be adapted to the component and process
GAMMA ASM 2026
The correct configuration for field and detail
All systems generate points clouds in .ply format and include TarazSurf software.
| Version | Cloud Point Resolution | Measuring area | Acquisition | Point cloud |
|---|---|---|---|---|
| Standard Resolution | 70 μm | 255 × 174 mm | 2 | 6 |
| Higher resolution | 25 μm | 70 × 50 mm | 2 | 6 |
| Wide-field | 400 μm | 1.200 × 800 mm | 2 | 6 |
| Fine. NEW | 1 μm | 10 × 10 mm | < 2 | 6 |
Declared operating range.
3D data ready for analysis and integration.
Acquisition, analysis and flow common to the range.
Off-line, automatic and in-line solutions.
NEW · END RESOLUTION SYSTEM
Control of precision finishes
The new variant extends the ASM platform to a lateral resolution of 1 μm on a range of 10×10 mm. It is designed for the inspection of polished, lapped and finely machined components, maintaining a rapid, optical and safe measurement even on delicate surfaces.
1 μmLateral resolution10 × 10 mmArea field< 2Measuring time
APPLICATIONS
From microfinish to large surfaces
The selection of the version depends on the area to be covered, the scale of detail and the cycle time required.
Automotive
Processed surfaces, precision components, wear, texture and process control.
Coatings
Topography, uniformity, finishing and defects on coatings and treated surfaces.
Additive manufacturing
Roughness, morphology and compliance of the surfaces produced by additive manufacturing.
Aerospace
Quick and traceable control of critical surfaces and components.
Precision finishings
Polished, lapped and finely machined components with Fine Resolution.
Large panels
Wide-field acquisition up to 1,200×800 mm in one measurement field.
TARAZSURF
Measurement, analysis and traceability in a single flow
Optical acquisition
The blue light fringe projection detects the contactless surface.
3D Point Cloud
The system generates the complete data in .ply format.
Area analysis
TarazSurf supports surface analysis according to ISO 25178.
Integration
Results and procedures can be adapted to the part and process of the customer.
FROM THE SUPERFAITH TO THE FULL FORMA
When ASM is not enough: Taraz PM
ASM is optimized for topography and spatial measurement of surfaces mainly accessible by a single orientation. For complex components requiring multiple views, rotations and a full three-dimensional reconstruction, PM adds photogrammetry, movement tracking and data fusion.
Compare PM and ASMWHAT ASM FOR YOUR SUPERFICIE?
We verify field, resolution and cycle time directly on the sample.
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TARAZ METROLOGY · POST-PROCESS MEASUREMENT
PM — 3D optical measurement after machining
Methrological station for final control of complex components in workshop and production. Integral frange projection, short-range photogrammetry and multiple viewpoints to achieve a full three-dimensional measure.
3D from multiple viewscomplete reconstruction
CADcomparison and deviations
Frange + photoscombined technologies
Productionfinal control
FINAL CONTROL
Measure the shape from multiple directions
PM acquires the component from different orientations and combines the measurements in a single 3D model. The precise tracking of the handling allows you to connect each view to the same reference system, while the recomposition algorithms merge the data of the different acquisitions.
The result can be compared with the nominal CAD model to immediately make the shocks visible from the tolerances and locate the areas that require verification.
- Components with curved surfaces, subframes and articulated geometries
- Adaptable configuration to size, shape and material of the piece
- Independent station for post-process inspection
COME FUNZIONA
From the acquisition from several views to the scaling map
The cycle is configured on the component and the metrological target.
Positioning
The component is placed on the rotary table at the measuring station.
Optical acquisition
Screening of fringes and photogrammetry detect form and references from multiple viewpoints.
Data fusion
Tracing the movement and recomposition of data gather acquisitions in a single 3D measure.
CAD Comparison
Nominal deviations and tolerances are highlighted to support the decision.
PROJECT FOR OFFICINE
An independent station for final inspection
The closed structure creates a controlled acquisition environment and brings optical metrology close to production. The configuration is optimized according to the piece and process, defining useful volume, sensors, movements, recipe and loading mode.
Quick SetupRepeatable acquisitionsDifferent materialsComplex shapesDedicated recipesCompliance Reports
APPLICATIONS
Where the single view is not enough
PM is indicated when the shape, orientation and completeness of the cover are decisive.
Processed components
Final control of shapes, quotas and deviations after milling, turning or grinding.
Additive production
Reconstruction of free-form components, curved surfaces and geometries produced by 3D printing.
Automotive and EV
Verification of components, supports, casings and assembly parts with respect to CAD.
Aerospace
Traceable inspection of complex parts and critical surfaces from multiple directions.
Assembly
Control of relative position of visible characteristics and overall geometry.
Research and pre-series
Quick comparison between real component, nominal model and subsequent process iterations.
PM O ASM?
Two complementary platforms
The choice depends on the result to be obtained, not only on the size of the sample.
CriteriaTaraz PMTaraz ASM
Main objectiveFull 3D shape and geometric complianceTopography, local form and aerospace roughness
AcquisitionMore views with traslation and tracked rotationAxial measurement from a prevailing orientation
TechnologyFrange projection + photogrammetryBlue light fringe projection
Ideal componentsComplex and three-dimensional geometryRelatively accessible or extended surfaces
ResultCast 3D model and CAD comparison2.5D point clouds and surface parameters
CONFIGURATION ON APPLICATION
Performance defined on the real component
Measurement range, accuracy, number of views, sensors and cycle time depend on size, geometry, material, finishing and tolerances required.The PM configuration is then defined after an application evaluation and sample test.
A COMPONENT TO REMEMBER?
We value coverage, references, tolerances and CAD comparison.
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METROLOGY LASER POINT AUTOFOCUS
Mitaka PF‑60
3D contactless profilemeter to measure shape, profile and roughness on extended areas, from mirror surfaces to transparent materials, without composition of fields.
Test PF‐60 on your sample
60 × 60 mmMeasuring range XY
0.1 μmResolution of the X-Y stairs
0.01 μmResolution of the AF scale
87°Measurable maximum angle
MORE VELOCE, SEMPLICE AND PRECESS
Large submicrometric areas and details with the same size
The Scan AF function is up to 50 times faster than the previous Mitaka method.The laser probe with a range of 0.5 μm and the precision XY table directly measure areas of tens of millimeters up to the submicrometric scale.
The PF‐60 is suitable for deformations of precision components, molding defects, wear volume and quantitative evaluation of scratches and tribological surfaces.
PRESTATIONS OF MEASURE
Quick 2D and 3D scanning, without stitching
The XY stage acquires coordinates over the entire race. The data comes from the continuous measurement of points and not from the union of separate images.
High precision extended area
Example of Fresnel lens: X 4,498 mm, Y 4,501 mm, Z 4,733 μm.
Quick AF scan
A measure requiring 1 hour and 20 minutes is performed in about 6 minutes; a 2D profile from 8,000 points takes about 15 seconds.
In pursuit of strong slopes
The autofocus sensor detects low levels of reflected light and measures steps and inclined surfaces up to 87°.
MAIN POINT AUTOFOCUS
Fire becomes a co-ordination of share
The 635 nm laser, with a power of less than 1 mW, crosses the lens and forms on the surface an optical probe with a radius of 0.5 μm. The reflected light returns to the AF sensor, which detects in real time the motion of the spot and reports the microscope in the focus position.
The method is classified by ISO 25178‐6 and documented as ISO 25178‐605.
Laser 635 nm
↓AF lens and optical
↓Sample surface
↑ reflected lightAutofocus sensor
Continuous correction of the Z quotaMEASURES AND ANALYSIS 3D
From shape to roughness, even on difficult materials
The reflectance of the surface affects little to the extent: the system operates on specular, transparent surfaces and with strong gradient variations.
2D profile with resolution 0.01 μm3D shape and shape removalProfile extractionImage of the area and simple dimensional measuresRoughness and wear volumeDeformation and ripple
TECHNICAL DATA PF‐60
Compact laboratory configuration
Installation envelope400 × 400 mm
Tool weight31 kg
Field X × Y × Z × AF60 × 60 × 60 × 10 mm
X-Y scale resolution0.1 μm
AF scale resolution0.01 μm
Method of measurementFocus ISO 25178‐605
Lasers635 nm, <1 mW
Data and images translated from official page Mitaka Kohki.
DUE CONFIGURATIONS
Choose the system based on geometry
EXTESE AREAPF-60
Autofocus laser microscope with motorized XYZ board. Standard area 60 × 60 × 10 mm; continuous scanning without composition of visual fields.
- Resolution XY 0.1 μm
- Profile, shape and roughness measures
- CSV/STL for CAD, FEM and reverse engineering
SCANSION TO THE AROUND5-axis MLP‐3P
Laser CMM with high-speed rotation and autofocus to measure internal, external surfaces and three-dimensional component profiles.
- Pieces up to 120 × 120 × 120 mm
- 5 programmable motorised axes
- Contour, rotondity, gears and calibers
MITAKA APPLICATIONS
Where conventional optical measurement meets its limits
Thin films and wafers
Step height, texture, roughness and profiles on reflective, absorbent or transparent surfaces.
Optics, lenses and films
Shape, profile and roughness of transparent elements without contact with the surface.
Microcomponents and MEMS
Geometry, cavity and dislivelli with submicrometric laser spots and nanometric resolution.
Tools and edges
Ripid corners, rays, sharp profiles, wear and cutting characteristics.
Gears and cylindrical components
Profiles, rotondity, internal and external surfaces by scanning MLP‐3P all‐around.
Reverse engineering
STL/CSV export, CAD comparison, prototyping and FEM analysis data.
Additive manufacturing
Topography, roughness, geometric compliance and characterization of complex surfaces.
Production Metrology
Repeatable presets, automatic scans, reports and homogeneous batch control.
PRINCIPLE OF MEASURE
Point Autofocus Profiling
The laser spot is focused directly on the surface and the autofocus sensor follows the height in real time. The XY movement generates continuous three-dimensional coordinates, reducing the criticalities typical of the fire and optical stitching variation.
ISO 25178‐605Established non-contact method for measuring areal surface texture.No stitchingThe topography derives from contiguous lines of measured points, not from the union of images.Live measurementImages, parameters and results are available during the acquisition.
PORT US THE COMPONENT
We compare PF‐60 and MLP‐3P on your real geometry.
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POLYRIX · SURROUND 3D SCANNERS
PolyScan X Series
Automatic, complete and secure 3D Metrology: a fixed network of cameras and projectors acquires the component from each direction, without robot trajectories and without risk of collision.
Evaluate a PolyScan application
6-8 minScan time from XS to XL6
±0,010 mmXS Volumetric Accuracy
0.25-6,5+ mComponent Size
12-32+Cameras and projectors
_
Full cover without moving the scanner
PolyScan is a multi-sensor 3D measurement system without moving parts. Modular columns distribute cameras and projectors around the piece to acquire millions of points in a single cycle.
- No trajectory programming
- No typical safety requirement of moving robots
- No complex recording with targets or software
- Minimum processing and acquisition without operator intervention
LIVEINSPECTION
The result becomes immediately readable on the component
A matrix of high-definition projectors displays deviation color maps on the piece. The operator can change the map and receive dynamic and intuitive feedback during the evaluation.
_
From the small paddle to the large structure
Modular configurations with 6, 12 or 24 MP cameras, Full HD color projectors and 4K optional.
XS
- Piece
- up to 0.25 m
- Accuracy
- ±0,010 mm
- Scanning
- 6-8 min
- Sensors
- 12 + 12
XM
- Piece
- up to 0.75 m
- Accuracy
- ±0,020 mm
- Scanning
- 6-8 min
- Sensors
- 12 + 12
XL6 / XL8 / XL10
- Piece
- 1,7-2.5 m
- Accuracy
- ±0,040-0,060 mm
- Scanning
- 6-15 min
- Sensors
- 12-20 + 12-20
XH
- Piece
- up to 6.5+ m
- Accuracy
- ±0,200 mm
- Scanning
- 16-24+ min
- Sensors
- 32+ + 32+
Accuracy based on third-party evaluation according to VDI/VDE 2634 part 2, accredited ISO 17025 laboratory and NIST traceability, as indicated in Polyrix documentation.
APPLICATIONS
Automatic control along the entire process
dimensional certification, in-process quality control, component inspection, moulds and matrices, repair assistance. Industries: automotive, aerospace, medical, defense, industry and energy.
Supported software: PolyWorks | Inspector plug-in, PolyScan Control Center and Polyrix API.
AUTOMATIC DIMENSION CONTROL
We define volume, accuracy and cycle time of your application.
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TOMOGRAPHY X-RAY FROM BANCO
nanoVoxel‑1000
Non-destructive three-dimensional analysis of the internal structures of small and medium samples, with compact laboratory configuration.
Evaluate your CT sample300 nmReliability of details
110 kVX‐ray sealed source
145 × 114 mmArea of the detector
15 kgMaximum sample weight
FEATURES
Compact micro‐CT, without dissecting the sample
Sealed source, flat panel detector from 2.940 × 2.304 pixels and samples indicating up to 300 mm in diameter and 200 mm in height.
Analysis of internal defects
Porosity, inclusions, cracks, assemblies and hidden geometries.
Imaging 4D in situ
Possible integration with mechanical or thermal load devices to observe the evolution of the sample.
Compact installation
Indicative dimensions 900 × 500 × 660 mm and vibration isolation system.
Application configuration
Hardware and software can be adapted to material, density and inspection target.
GUARDING DENTRO SENZA DISTRUGGIE
We value contrast, density and resolution on the sample.
← Back to productsWe see the invisible.
ST‐COBOT · EXPENDITURE AND AUTOMISED MEASURE
We see the invisible.
We measure the impossible.
3D digital microscopy, collaborative robotics and artificial intelligence for accurate, intelligent and non-destructive quality control, in the laboratory and in line of production.
AccuracyIntelligenceProductivity
ROBOTICA AND ARTIFICIAL INTELLIGENCE
From the position of the piece to the quality decision
We design control around the sample: handling, optical acquisition, measurement, classification and reporting.The performance occurs with an application test and agreed acceptance criteria.
01
Positioning
Cobot, portal or pick and place present the component in the defined poses.
02
Acquisition
HIROX, NPS and other sensors acquire images, profiles and surfaces in the control points.
03
Analysis
Methrological recipes and IA models identify candidate abnormalities and measure deviations.
04
Exit
Validated rules produce OK, verification or discard with images, measurements and traceability.
MICROELETTRO.
PCB and assemblies
Repeatable scans of tracks, welds, bonding and contamination, with localization of areas to be checked.
MECHANICAL
Bearings and Components
Cell concept with draw from the line, presentation under the optics, measurement of geometries and surfaces and return of the outcome to the process.
COMPLESS HOURS
Multidirectional Inspection
The robot orientates optics or pieces to reach difficult edges, cavities and sides; the recipe records poses and acquisition parameters.
The images show configurations and application concepts. The possible IA classification requires representative data, validation and performance verification on the specific process.
ST‐COBOT
The microscope automatically reaches every control point
The six-degree robotic stave allows for high-precision encoded and programmable movements. The poses, sequences and capture parameters can be recalled to control components and batches in a repeatable way.
- Programmable robotic handling on multiple sides of the component.
- Possible translation unit on the robot's wrist for profile and roughness measurements.
- Configuration prepared for online integration and data exchange with the factory.
6 degrees of freedomAutomatic control of surfaces, edges, cavities and distributed points.
VISIVE CONFIGUREMENT
From single component to large surfaces
The platform is configured according to the piece, the areas to be reached and the required control sequence.
CONTROLS IN LINE
Seven coordinate functions in one platform
From fault detection to data management: the cell can combine microscopy, metrology, automatic analysis and process traceability.
Micro Defect Detection
Automatic detection of micro-defects and abnormalities with artificial intelligence algorithms.
Dimensional 3D scanning
High-resolution 3D acquisition for dimensional measurements and geometric verifications.
Particle Analysis
Automatic analysis of particles, contamination and residues with AI-assisted classification.
Topography and roughness
3D measurement and analysis of surface topography, profiles and roughness parameters.
Automation and IA
Intelligent and adaptive inspection to support real-time control decisions.
Tracking and Data Management
Management, storage and traceability of inspection data and process reports.
Multitechnology Related Analysis
Integration of multiple technologies for a complete and multi-dimensional reading of quality control.
Structural controls with PAUT technology
The phased array ultrasound (PAUT) is a non-destructive control technique. The probe directs and focuses the beam at different depths and angles to detect and locate internal discontinuity in welds, pipes and metal components.
For an automated inspection, you can evaluate the integration of a PAUT probe, correcting the ultrasound indications with the position on the piece and with optical or dimensional reliefs.
Non-destructive controls and shared laboratories
Ekoscan documents the use of PAUT for axial and circumferential welds. ENEA carries out non-destructive ultrasound characterization activities and provides research infrastructure available to enterprises and scientific entities in the manner of individual laboratories.
DEMO INTERACTIVE · VISION + IA
Automatic detection of defects
Choose a sample and start the simulation: the recipe locates the anomalies, applies configurable thresholds and returns a traceable outcome.
Analysis complete
Inspection recipe PCB‑BOND‑04Confidence threshold ≥ 90%
AUTOMATIC EXITReview required
Four areas exceed the thresholds set in the inspection recipe.
- Anomaly candidates
- 4
- Average confidence
- 94%
- Analysing time
- 2.8 s
- 01 · Track discrepanciesConfidence 97%
- 02 · Surface residueConfidence 95%
- 03 · Uneven edgeConfidence 93%
- 04 · MicroscratchConfidence 91%
Demonstration simulation on predefined samples; it is not a test result. Classes, datasets, thresholds and acceptance criteria are validated on the component and process of the customer.
1 · Automatic acquisition2 · Localization IA3 · Classification4 · OK / verification / discard
Higher quality
Increased accuracy, repeatability and reliability of control.
Non-destructive control
Secure and contactless optical technologies with the component.
Operational efficiency
Faster processes, reduction of waste and increased productivity.
Artificial intelligence
Support for decisions through classification and automatic analysis.
BI‐MU 2026 · FIERAMILANO RHO
HiroxBot at BI‐MU 2026
From 13 to 16 October 2026, Simitecno presented solutions for Failure Analysis, automatic metrology and non-destructive quality control.
Select the inn to display it in the original size.
FROM THE MANUAL CONTROL TO THE AUTOMATIC RESEARCH
We define points, times, technologies and criteria of inspection.
SAMPLE ANALYSIS
Tell us what you need to measure.
Send us the essential information: a Simitecno specialist will get back to you to assess the technology, the trial and the expected result.
- Describe the component, material or defect
- Specify the dimensions and the accuracy required
- We arrange a demo or a test on your sample
Prefer to talk right away?+39 06 7234320info@simitecno.it
CONTACT
Speak directly with Simitecno’s technical team
For sales information, demonstrations, application analysis and support.
Rome
Via Frascineto, 24
00173 Rome
IIT Milan Demo Centre
Center for Nano Science and Technology
Via Raffaele Rubattino, 81 · Milan
Marco Brecciaroli
Managing Director
+39 335 5611710marco.brecciaroli@simitecno.itA TECHNICAL ANSWER, NOT A GENERIC ONE
Tell us what you need to observe, measure or automate.
← All events
Upcoming workshop roadmap
3D microscopy for cultural heritage
Non-invasive surface documentation and before/after comparison of restoration work.
Applications and technical path
- Identification of craquelure, waxing and lifting.
- 3D reconstruction of the deformations of pictorial film.
- Study of texture, color alterations and damaged areas.
- High resolution images for documentation and comparison over time.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
Integrated HIROX system for ceramics
3D microscopy, structured light and artificial intelligence for surface inspection, from raw material to finished product.
Applications and technical path
- High resolution analysis of microstructures and superficial defects.
- 3D measurements of topography and complex geometries.
- Detection and classification of defects with image analysis and AI.
- Applications in research and development and quality control in production.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
HIROX and MITAKA for thin films
Multiscale imaging and laser profilometry for the characterisation of thin films and photovoltaic devices.
Applications and technical path
- Observation HIROX with polarized and coaxial light.
- Measurement of profiles and height variations with MITAKA PF-60.
- Case study: Nb₂O₅ niobium oxide film on borosilicate glass.
- In the illustrated case: nominal thickness 20 nm; measured height variation of about 19.95 nm.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
3D microscopy for metallography
From microstructures to failure analysis: observation, 2D/3D measurement and quantitative image analysis.
Applications and technical path
- Analysis of fractures, microfractures, cracks and corrosion.
- It has grains, studies of phases and inclusions.
- 3D topography, roughness, porosity and process defects.
- Workflow HIROX + MIPAR: segmentation, measurements, batches and reports with noted images.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
Other application cases
Additional 3D scanning cases, counts grains, roughness and corrosion to compare microstructures and surface treatments.
← All events
Upcoming workshop roadmap
3D digital microscopy for microelectronics
Inspection of assemblies, packaging and integrated circuits with 360° imaging, stitching and 2D/3D measurement.
Applications and technical path
- Control of welded components, joints and flux residues.
- Observation of wafer pattern, tracks and details of microchip.
- Search for microcracks and process defects on accessible surfaces.
- Confocal profile NPS and 3D reconstructions for surface characterization.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
3D microscopy for fashion and jewellery
Fibres, leathers, finishes and jewellery: observing the details and documenting material quality.
Applications and technical path
- Morphology of natural and synthetic fibres: defects, breakages and contaminations.
- Microfessure, finishing and wear of skins and leathers.
- Quality of polishing, porosity and melting defects in precious metals.
- Inspection of frames, frames and engravings; 2D/3D measurements.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
Other application cases
Application cases of 2D/3D measurements of defects, layer thicknesses and comparison of treated surfaces.
← All events
Upcoming workshop roadmap
3D microscopy for the life sciences
Zoology, entomology and botany through multifocal imaging, 3D reconstruction and sample documentation.
Applications and technical path
- Study of scales, hairs, wings, composite eyes and other external structures.
- Morphological comparison and character documentation for taxonomy.
- Leaf surfaces, seeds, flowers and plant structures in 2D/3D.
- Digital cataloguing of collections and production of images for research and teaching.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
- Video application HIROX vo
- Video application HIROX vo
- Video application HIROX vo
- Video application HIROX vo
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
3D microscopy for Earth sciences
Rocks, minerals, fossils and sediments: morphological characterisation and microtopographic surveys.
Applications and technical path
- Studio of microfractures, veins and superficial alterations of the rocks.
- Analysis of crystals, inclusions and surface structures of minerals.
- Documentation of fossils, fingerprints and microfossil remains.
- Weaving, granulometry and porosity of sediments; introduction to the LIBS module for elementary analysis.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
- Video application HIROX vo
- Video application HIROX vo
- Video application HIROX vo
- Video application HIROX vo
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
3D microscopy for forensic science
Micro-traces, exhibits and materials: imaging and measurement to document and compare observable details.
Applications and technical path
- Morphological documentation of fibers, hair, glass fragments and paint.
- Comparative analysis of surface traces and 2D/3D measurements.
- Study of fractures, wear, corrosion and contamination of the finds.
- Comparison of brush strokes and pattern processing, with image storage.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
HIROX for biomaterials and scaffolds
From polymers to scaffolds: morphological analysis, topography and surface inspection for biomaterials research.
Applications and technical path
- Morphology, roughness and superficial porosity of biomaterials and scaffold.
- Inspection of surfaces after CNC machining or plasma treatments.
- Biocompatible ceramics: observation of fractures and microfractures.
- Illustrated case studies: PDMS films with NdFeB particles and mPE surfaces functionalized with natural extracts.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
- Video application HIROX vo
- Video HIROX Europe: 360° inspection
- Video application HIROX vo
- Solutions website logo PNG - Similar PNG -
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
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Upcoming workshop roadmap
3D microscopy for glass and coatings
Glass failure analysis, surface defects and coatings: illumination, dimensional measurement and topography.
Applications and technical path
- Comparison of fracture surfaces with epi-coaxial and rotating optics.
- Observation of defects with different lighting modes.
- 2D sizes of defects, 3D textures and roughness of surfaces.
- Study of bubbles, cracks, delaminations and uniformity of coatings.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
- Video application HIROX vo
- Video application HIROX vo
- Video application HIROX vo
- Video application HIROX vo
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
3D microscopy for fibres and textiles
From single fibres to fabric: measurement, stitching and documentation for laboratory, development and quality control.
Applications and technical path
- morphological analysis of natural, synthetic and mixed fibres.
- Study of weaving, uniformity and density of weaving and warp threads.
- Evaluation of finishes and treatments; identification of irregularities.
- 3D reconstructions, prototyping and traceability of analysis.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
- Video application HIROX vo
- Video application HIROX vo
- • Identification and measurement of individual micrometric fibres in environmental samples by optical and confocal microscope – ScienceDirect di
- • Archaeological tissues: a review of current research della
- • Mechanism of preparation and formation of photonic crystals coloured on crude yarns di
- • 3D reconstruction of the microstructure of nonwoven fabrics based on depth from fire di
- • Identification of varieties of natural textile fibres based on Vis/NIR spettro spectroscopy technology
- • Silk, microfibre and nanofibre particles: a comparative study of their functions in hydrogel scaffolds for 3D printing la
- • Color design for cotton fabrics by rapid situ synthesis of metallic oxides on the fiber surface using the method assisted by organic solvents i
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
Other application cases
Stitching of extended areas to document the structure of the sample and compare different areas.
← All events
Upcoming workshop roadmap
Surface and failure analysis
From topography to defects: optical metrology, coatings, wear and inspection automation.
Applications and technical path
- Roughness, texture, fractures and cutting edges.
- Measures not in contact with depth, heights, angles and distances.
- Uniformity of coatings and comparison before/after treatment.
- HiroxBot, image analysis and traceability for quality control workflows.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
- Video application HIROX vo
- Video application HIROX vo
- Video application HIROX vo
- Video application HIROX vo
- Video HIROX Europe: 360° inspection
- Video application HIROX vo
- Video HIROX Europe: 360° inspection
- Video application HIROX vo
- Solutions website logo PNG - Similar PNG -
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
3D microscopy for paper, board and packaging
Fibre structure, finishes and defects for the development and inspection of packaging materials.
Applications and technical path
- Observation of the disposition and integrity of fibers.
- Study of surfaces, coatings and laminations.
- Identification of microfractures, inclusions and irregularities.
- 2D/3D measurements and reports to compare samples and production processes.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
Paper, printing and inks
Paper texture, ink distribution and print detail with dedicated imaging and illumination.
Applications and technical path
- Study of fibers, pigments and ink distribution uniformity.
- Stitching and 3D reconstructions on extended areas.
- Comparison between observations in visible and infrared light.
- Cases illustrated in PDF: papyrus, underlying designs and print details overlapped with a signature.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
3D microscopy for composites
Fibres, matrix and laminates: multiscale inspection, dimensional measurement and defect analysis.
Applications and technical path
- Areas rich in resin, fiber alignment and layer arrangement.
- Measurements of the thickness of the layers and study of visible voids.
- Stitching to extend the analyzed area and compare the laminate areas.
- 3D measurement cases of defects and aerospace components inspection.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← All events
Upcoming workshop roadmap
Dermatology, trichology, cosmetics and pharmaceuticals
Imaging and measurement for research, surface characterisation and quality control of products and materials.
Applications and technical path
- Observation of superficial morphology of hair and skin samples.
- Nail polish test and make-up; characterization of surfaces and packaging.
- Particle count through binaryization and RGB selection.
- Image documentation and results for research and quality control activities.
A comparison of laboratories, research and industry, with observations and measures on the samples. Dates, venue and modes of participation will be communicated with the workshop calendar.
Videos and insights
Information: mario.brecciaroli@simitecno.it · +39 335 6252606
← Past Events
TRADE FAIR · LIVE TESTING
BI-MU – Milan
13–16 October 2026 · Fieramilano Rho · Pavilion 22 · Stand E31
Announced configuration
- 1 gantry with Hirox
- 2 Hirox with benchtop stands, one of them with NPS
- 1 cobot with Taraz
- 1 cobot cell with Hirox
Program and configuration announced for this appointment. Contact SIMITECNO to request materials or arrange a new application test.
Digital and confocal microscopy 3D and textured light
Advanced techniques for three-dimensional characterization of surfaces.The BI-MU program provided application analysis on samples with the Simitecno specialists.
360° Imaging without manipulating the sample and 2D/3D multi-scale scans and measurements.
Non-contact scans of profiles and surfaces with white light color confocal sensor.
MITAKA laser profile to measure height variations and characterize surfaces.
Exposed instrumentation
- Hirox with benchtop stand
- NPS
Contact the SIMITECNO team to agree to participation, demonstrations and samples of interest.
Announced configuration
- 2 Hirox with benchtop stands, one of them with NPS
- 1 cobot with Taraz
Program and configuration announced for this appointment. Contact SIMITECNO to request materials or arrange a new application test.
Exposed instrumentation
- Hirox with benchtop stand
- NPS
Contact the SIMITECNO team to agree to participation, demonstrations and samples of interest.
Announced configuration
- 1 Mitaka
- 1 Hirox with Rvomax + NPS
Program and configuration announced for this appointment. Contact SIMITECNO to request materials or arrange a new application test.
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OPEN HOUSE
Open House Werth Italia
24 and 25 November 2026 · 09:00–13:00 and 14:00–17:00 on both days
Werth Italia Srl · Via Sempione 17 · 21011 Casorate Sempione (VA)
Programme
Live demonstrations of Hirox 3D digital microscopy, multisensor CMMs and computed tomography.
Open access to Werth’s laboratories and discussions with experts on equipment, technologies and software for 3D optical measurement, multisensor metrology and computed tomography.
info@werth-italia.it · +39 0331 770746
SIMITECNO contacts
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WORKSHOP
Automated microdefect detection and 3D surface topography
IIT workshop – Milan
Dates to be defined · IIT · CNST · Milan
Exposed instrumentation
- Hirox with benchtop stand
- NPS
Contact the SIMITECNO team to agree to participation, demonstrations and samples of interest.
Exposed instrumentation
- Hirox
- Mitaka
Contact the SIMITECNO team to agree to participation, demonstrations and samples of interest.
Configuration to be confirmed
Contact the SIMITECNO team to agree to participation, demonstrations and samples of interest.
Technologies and applications
Illustrative images of SIMITECNO application themes. The MECSPE exhibition configuration is to be defined.
Technologies for quality control of materials
3D digital and confocal microscopy, optical and dimensional metrology, non-destructive controls and chemical-physical analysis.
Quality Talks: from sample to data
3D Microscopy, Profilemetry, AI and Robotics to compare to applications and quality control requirements.
INTELLIGENCE
News
Technologies and applications for analysis and quality control of materials.
TECHNOLOGICAL FOCUS · 6 OCTOBER 2026
LIBS and HIROX: from image to elementary analysis
The microscopic observation identifies the point of interest.The LIBS spectroscopy helps to characterize its elementary composition.
What is LIBS
LIBS means Laser-Induced Breakdown Spectroscopy, laser-induced plasma emission spectroscopy. A focused laser pulse removes a very small amount of material and generates a plasma.
The technique involves a local microablation: on the analyzed point a small crater can remain.
The value of matching with the microscope
The images of the presentation show a LIBS module combined with HIROX: sample observation, selection of an area and acquisition of the spectrum can thus be part of a related characterization path.
The correlation between morphology and composition can support the analysis of inclusions, particles and unevenness of materials.
Applications of interest
- Local characterization of metals and alloys.
- Study of inclusions and foreign particles.
- Analysis of ceramic materials, glass and geological samples.
- Comparison between sample areas with different morphology.
From the demonstration to your sample
The detectable elements, detection limits and quantitative analysis possibilities depend on the material, configuration and calibration.
To learn more about HIROX–LIBS, share the material and area you want to analyze with SIMITECNO.
Request information about LIBSTECHNICAL DOCUMENTATION · HIROX
MS-LIBS: microscope and elementary analysis in the same system
The Fujikin documentation presented at JASIS 2026 indicates the technical collaboration of HIROX and Smart Laser & Plasma Systems. The system focuses a pulsed laser on the point observed under the microscope and analyzes the light of the generated plasma.
From the point observed to the composition
The brochure describes local analysis, two-dimensional mapping of the elements and deep analysis. The spot declared from 30 μm; the sensitivity is indicated in the ppm–% range, with performance to be evaluated on the material and the measurement conditions.
Comment application SIMITECNO. Correlating image and composition can help investigate a foreign particle, inclusion or uneven area. The mapping allows you to evaluate how the elements are distributed in the analyzed area.
Materials and applications
- Metals and alloys: identification and study of segregation.
- Materials for batteries: distribution and uniformity of elements.
- Electronic materials: microcontaminants and localized analysis.
- Deep analysis: variations of the composition from the surface to the inside.
The laser removes a small amount of material: it is necessary to evaluate the acceptability of the microablation on the sample.
RESEARCH · COMMENTARY BIBLIOGRAPHY
Publications: HIROX in LIBS research
These studies cite HIROX microscopes for the observation or measurement of samples in LIBS research. They document a complementary use of the microscope; they do not constitute a validation of the new MS-LIBS integrated system.
2025 · ACS OMEGA · MINERAL
Mixture Detection Using Deep-UV Raman-LIBS Autofocus-Based Compact Chemical Spectroscopic Sensor
HIROX RH-8800, 4000×. In Figure 4, microscopic images show the mineral samples W30, olivine and their mixture.
Comment SIMITECNO. Documenting morphology and distribution of grains helps to interpret the spectroscopic analysis of heterogeneous materials.
Read the publication · DOI 10.1021/acsomega.5c038012021 · APPLIED OPTICS · ADDITIONAL MANIFATTURE
Surface hardness determination of 3D printed parts using laser-induced breakdown spectroscopy
Jinwei Yang, Linghua Kong, Guofu Lian and Tongfei You · Applied Optics 60, 499–504. HIROX KH-1300 The study examines the relationship between LIBS signals and the surface hardness of the 18Ni300 maraging steel printed in 3D.
Comment SIMITECNO. Measuring the crater allows to document the effect of the laser on the surface and to support a geometrical control of the spectral response.
Read the publication · Applied Optics2013 · SPIE · CULTURAL GOODS
Use of the LIBS method in oil paintings examination...
The work of E. Modzelewska and collaborators concerns the examination of oil paintings through LIBS and cites microscopes HIROX 8700 in the observation path.
Comment SIMITECNO. The microscopic observation can be accompanied by the study of painting surfaces and the documentation of the area analyzed.
Read the publication · DOI 10.1117/12.2020694The SIMITECNO comments are interpretations and not quotes of the authors. Full texts and figures can be consulted with publishers according to the respective conditions of access. Sources consulted on 6 October 2026.
Initial images: presentation "screenshot promotional video" provided at SIMITECNO. MS-LIBS photos and brochures: Fujikin, with technical collaboration declared HIROX / Smart Laser & Plasma Systems.
_
Taking a closer look at materials for over 40 years.
We help industry and research to observe, measure and understand materials. We start from a sample, a defect or a concrete question and build the most suitable control path.
OUR IDENTITY
Application expertise, tools and people.
Simitecno S.r.l. is based in Rome and operates in quality control of materials. We support laboratories, research centers and enterprises in the choice and integration of technologies for surface analysis, metrology and non-destructive controls.
Our work combines technical advice, sample demonstrations, system configuration, training and assistance.
HOW TO WORK
From problem to decision.
Let's hear the case
Material, geometry, defect and measurement target define technical demand.
Let's try on the sample
We compare technologies and configurations on a real case, in the laboratory or at the customer.
We integrate the solution
From the bench to the automated cell, we adapt data acquisition, measurement and flow to the process.
We stand by the team
Training, application support and assistance help make control repeatable.
DIMOSTRATIONS AND RESEARCH
The test on your samples is the starting point.
In the Demo Center at IIT–CNST in Milan, you can explore the HIROX 3D digital microscope and the NPS confocal profilemetry. We work with the research world and with technological partners to translate new measurement capabilities into industrial applications.
Organize a demonstration →THE COMPETENCES
A single interlocutor, complementary technologies.
We follow applications in aerospace, automotive, energy, microelectronics, manufacturing, cultural heritage and materials research.
WORK
What problem do you want to solve?
Tell us what you need to observe or measure: we will evaluate with you an application path and a test on the sample.
Contact Simitecno← Back to the HIROX section
SCIENTIFICATION RESEARCH · BIBLIOGRAPHY
HIROX in research
A collection of publications documenting the use of HIROX digital microscopes in scientific studies. Each card indicates the application observed and refers to the original article, with figures and methodological details.
The opening photographs of the cards are illustrative images already present on the Simitecno website: they are not figures from the articles. The original scientific images are found in the related publications. The collection is selective and up-to-date, not an exhaustive census.
No publication corresponds to the research.
Do you have an application to check?
We can evaluate 2D/3D observations, topography and documentation of your sample with the most suitable configuration.
Request an application test